SN54HCT00, SN74HCT00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SCLS062D – NOVEMBER 1988 – REVISED AUGUST 2003
D
D
D
Operating Voltage Range of 4.5 V to 5.5 V
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 20-µA Max ICC
D
D
D
D
Typical tpd = 10 ns
±4-mA Output Drive at 5 V
Low Input Current of 1 µA Max
Inputs Are TTL-Voltage Compatible
SN54HCT00 . . . J OR W PACKAGE
SN74HCT00 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1
14
2
13
3
12
4
11
5
10
6
9
7
8
1B
1A
NC
VCC
4B
VCC
4B
4A
4Y
3B
3A
3Y
1Y
NC
2A
NC
2B
4
3 2 1 20 19
18
5
17
6
16
7
15
8
14
9 10 11 12 13
4A
NC
4Y
NC
3B
2Y
GND
NC
3Y
3A
1A
1B
1Y
2A
2B
2Y
GND
SN54HCT00 . . . FK PACKAGE
(TOP VIEW)
NC – No internal connection
description/ordering information
These devices contain four independent 2-input NAND gates. They perform the Boolean function Y = A • B or
Y = A + B in positive logic.
ORDERING INFORMATION
PACKAGE†
TA
PDIP – N
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
Tube of 25
SN74HCT00N
Tube of 50
SN74HCT00D
Reel of 2500
SN74HCT00DR
Reel of 250
SN74HCT00DT
SOP – NS
Reel of 2000
SN74HCT00NSR
HCT00
SSOP – DB
Reel of 2000
SN74HCT00DBR
HT00
Tube of 90
SN74HCT00PW
Reel of 2000
SN74HCT00PWR
Reel of 250
SN74HCT00PWT
CDIP – J
Tube of 25
SNJ54HCT00J
SNJ54HCT00J
CFP – W
Tube of 150
SNJ54HCT00W
SNJ54HCT00W
LCCC – FK
Tube of 55
SNJ54HCT00FK
SOIC – D
–40°C 85°C
–40 C to 85 C
TSSOP – PW
–55°C 125°C
–55 C to 125 C
SN74HCT00N
HCT00
HT00
SNJ54HCT00FK
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2003, Texas Instruments Incorporated
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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1