TPS737xx
www.ti.com
SBVS067G – JANUARY 2006 – REVISED OCTOBER 2007
1A Low-Dropout Regulator
with Reverse Current Protection
FEATURES
1
• Stable with 1.0µF or Larger Ceramic Output
Capacitor
• Input Voltage Range: 2.2V to 5.5V
• Ultra-Low Dropout Voltage: 130mV typ at 1A
• Excellent Load Transient Response—Even
With Only 1.0µF Output Capacitor
• NMOS Topology Delivers Low Reverse
Leakage Current
• 1.0% Initial Accuracy
• 3% Overall Accuracy Over Line, Load, and
Temperature
• Less Than 20nA typical IQ in Shutdown Mode
• Thermal Shutdown and Current Limit for Fault
Protection
• Available in Multiple Output Voltage Versions
– Adjustable Output: 1.20V to 5.5V
– Custom Outputs Available Using Factory
Package-Level Programming
2
DESCRIPTION
The TPS737xx family of linear low-dropout (LDO)
voltage regulators uses an NMOS pass element in a
voltage-follower configuration. This topology is
relatively insensitive to output capacitor value and
ESR, allowing a wide variety of load configurations.
Load transient response is excellent, even with a
small 1.0µF ceramic output capacitor. The NMOS
topology also allows very low dropout.
The TPS737xx family uses an advanced BiCMOS
process to yield high precision while delivering very
low dropout voltages and low ground pin current.
Current consumption, when not enabled, is under
20nA and ideal for portable applications. These
devices are protected by thermal shutdown and
foldback current limit.
DRB PACKAGE
3mm x 3mm SON
(TOP VIEW)
OUT 1
8 IN
N/C 2
APPLICATIONS
•
•
•
7 N/C
NR/FB 3
6 N/C
GND 4
Point of Load Regulation for DSPs, FPGAs,
ASICs, and Microprocessors
Post-Regulation for Switching Supplies
Portable/Battery-Powered Equipment
5 EN
DCQ PACKAGE
SOT223
(TOP VIEW)
Optional
VIN
IN
OUT
TPS737xx
TAB IS GND
6
VOUT
1.0mF
EN
GND
FB
1
IN
Typical Application Circuit
2
3
4
5
GND
EN
OUT NR/FB
1
2
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2007, Texas Instruments Incorporated
