BurrĆBrown Products
from Texas Instruments
ADS8505
SLAS180B – SEPTEMBER 2005 – REVISED JUNE 2007
16-BIT 250-KSPS SAMPLING CMOS ANALOG-TO-DIGITAL CONVERTER
FEATURES
APPLICATIONS
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105dB SFDR at 250-kHz Sample Rate
Standard ±10-V Input Range
±1.5 LSB Max INL
±1 LSB Max DNL, 16-Bits No Missing Codes
±2 mV Max Bipolar Zero Error With ±0.4
PPM/°C Drift
±0.1% FSR Max Full-Scale Error With ±2
PPM/°C Drift
Single 5-V Supply Operation
Pin-Compatible With ADS7805 (Low Speed)
and 12-Bit ADS8504/7804
Uses Internal or External Reference
Full Parallel Data Output
70-mW Typ Power Dissipation at 250 KSPS
28-Pin SSOP and SOIC Packages
Industrial Process Control
Data Acquisition Systems
Digital Signal Processing
Medical Equipment
Instrumentation
DESCRIPTION
The ADS8505 is a complete 16-bit sampling A/D
converter using state-of-the-art CMOS structures. It
contains a complete 16-bit, capacitor-based, SAR
A/D with S/H, reference, clock, interface for
microprocessor use, and 3-state output drivers.
The ADS8505 is specified at a 250-kHz sampling
rate over the full temperature range. Precision
resistors provide an industry standard ±10-V input
range, while the innovative design allows operation
from a single +5-V supply, with power dissipation
under 100 mW.
The ADS8505 is available in 28-pin SOIC and 28-pin
SSOP packages, both fully specified for operation
over the industrial –40°C to 85°C temperature range.
Clock
Successive Approximation Register and Control Logic
R/C
CS
BYTE
BUSY
CDAC
9.8 kΩ
± 10 V Input
5 kΩ
2 kΩ
Comparator
Output
Latches
and
Three
State
Drivers
Three
State
Parallel
Data
Bus
CAP
Buffer
Internal
+2.5 V Ref
4 kΩ
REF
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2007, Texas Instruments Incorporated
