INTEGRATED CIRCUITS
74F32
Quad 2-input OR gate
Product specification
Supersedes data of 1990 Oct 04
IC15 Data Handbook
Philips
Semiconductors
2000 Aug 02
Philips Semiconductors
Product specification
Quad 2-input OR gate
74F32
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
VCC
Supply voltage
–0.5 to +7.0
VIN
Input voltage
–0.5 to +7.0
V
IIN
Input current
–30 to +5
mA
VOUT
Voltage applied to output in high output state
–0.5 to VCC
V
IOUT
Current applied to output in low output state
40
mA
0 to +70
Tamb
Operating free air temperature range
°C
–40 to +85
°C
Tstg
Storage temperature range
–65 to +150
°C
Commercial range
Industrial range
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
5.0
5.5
VCC
Supply voltage
4.5
VIH
High-level input voltage
2.0
V
VIL
Low-level input voltage
0.8
V
IIk
Input clamp current
–18
mA
IOH
High-level output current
–1
mA
IOL
Low-level output current
20
mA
Tamb
Operating free air temperature range
V
Commercial range
0
+70
°C
Industrial range
–40
+85
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
TEST CONDITIONS1
PARAMETER
LIMITS
MIN
TYP2
UNIT
MAX
Low-level output voltage
2.5
±5%VCC
2.7
VCC = MIN, VIL = MAX
High-level output voltage
±10%VCC
±10%VCC
0.30
0.50
V
VIH = MIN, IOl = MAX
VOL
VCC = MIN, VIL = MAX
VIH = MIN, IOH = MAX
VOH
±5%VCC
0.30
0.50
V
-0.73
-1.2
V
V
3.4
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
II
Input current at maximum input
voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
IOS
Short-circuit output current3
VCC = MAX
ICC
Supply current (total)
-0.6
mA
-150
-60
mA
mA
ICCH
VCC = MAX
VIN = 4.5V
6.1
9.2
ICCL
VCC = MAX
VIN = GND
10.3
15.5
mA
NOTES:
1 For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2 All typical values are at VCC = 5V, Tamb = 25°C.
3 Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
2000 Aug 02
3
