IDT74FCT162501AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS
18-BIT REGISTERED
TRANSCEIVER
IDT74FCT162501AT/CT
FEATURES:
DESCRIPTION:
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The FCT162501T 18-bit registered transceivers are built using advanced
dual metal CMOS technology. These high-speed, low-power 18-bit registered
bus transceivers combine D-type latches and D-type flip-flops to allow data flow
in transparent, latched and clocked modes. Data flow in each direction is
controlled by output-enable (OEAB and OEBA), latch enable (LEAB and LEBA)
and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device
operates in transparent mode when LEAB is high. When LEAB is low, the A data
is latched if CLKAB is held at a high or low logic level. If LEAB is low, the A bus
data is stored in the latch/flip-flop on the low-to-high transition of CLKAB. OEAB
is the output enable for the B port. Data flow from the B port to the A port is similar
but requires using OEBA, LEBA and CLKBA. Flow-through organization of
signal pins simplifies layout. All inputs are designed with hysteresis for improved
noise margin.
The FCT162501T has balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output fall
times–reducing the need for external series terminating resistors. The
FCT162501T is a plug-in replacement for the FCT16501T and ABT16501 for
on-board bus interface applications.
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0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical tSK(o) (Output Skew) < 250ps
Low input and output leakage ≤ 1µA (max.)
ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
Balanced Output Drivers (±24mA)
Reduced system switching noise
Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V,
TA = 25°C
Available in SSOP and TSSOP packages
FUNCTIONAL BLOCK DIAGRAM
OEAB
CLKBA
LEBA
1
30
28
27
OEBA
CLKAB
LEAB
55
2
C
A1
3
C
D
D
54
C
C
D
B1
D
TO 17 OTHER CHANNELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
SEPTEMBER 2009
1
© 2009 Integrated Device Technology, Inc.
DSC-2753/6
IDT74FCT162501AT/CT
FAST CMOS 18-BIT REGISTERED TRANSCEIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%
Symbol
Test Conditions(1)
Parameter
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
IIH
Input HIGH Current (Input pins)(5)
VCC = Max.
—
—
±1
µA
—
—
±1
—
—
±1
—
—
±1
VO = 2.7V
—
—
±1
VO = 0.5V
—
—
±1
VI = VCC
Input HIGH Current (I/O pins)(5)
IIL
Input LOW Current (Input pins)(5)
VI = GND
Input LOW Current (I/O pins)(5)
IOZH
High Impedance Output Current
IOZL
(3-State Output pins)(5)
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
—
–0.7
–1.2
V
IOS
Short Circuit Current
VCC = Max., VO = GND(3)
–80
–140
–250
mA
VH
Input Hysteresis
—
100
—
mV
ICCL
ICCH
ICCZ
Quiescent Power Supply Current
—
5
500
µA
VCC = Max.
—
VCC = Max.
VIN = GND or VCC
µA
OUTPUT DRIVE CHARACTERISTICS
Min.
Typ.(2)
Max.
Unit
Output LOW Current
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
60
115
200
mA
IODH
Output HIGH Current
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
–60
–115
–200
mA
VOH
Output HIGH Voltage
VCC = Min.
IOH = –24mA
2.4
3.3
—
V
IOL = 24mA
—
0.3
0.55
V
Symbol
IODL
Test Conditions(1)
Parameter
VIN = VIH or VIL
VOL
Output LOW Voltage
VCC = Min.
VIN = VIH or VIL
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ±5µA at TA = –55°C.
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