IDT74FCT163827A/C
3.3V CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
3.3V CMOS 20-BIT BUFFER
IDT74FCT163827A/C
FEATURES:
DESCRIPTION:
• 0.5 MICRON CMOS Technology
• Typical tSK(o) (Output Skew) < 250ps
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
• VCC = 3.3V ± 0.3V, Normal Range, or VCC = 2.7V to 3.6V, Extended
Range
• CMOS power levels (0.4μ W typ. static)
μ
• Rail-to-rail output swing for increased noise margin
• Low Ground Bounce (0.3V typ.)
• Inputs (except I/O) can be driven by 3.3V or 5V components
• Available in TSSOP package
The FCT163827 20-bit buffer is built using advanced dual metal CMOS
technology. These 20-bit bus drivers provide high-performance bus
interface buffering for wide data/address paths or busses carrying parity.
Two pairs of NAND-ed output enable controls offer maximum control
flexibility and are organized to operate the device as two 10-bit buffers or
one 20-bit buffer. Flow-through organization of signal pins simplifies layout.
All inputs are designed with hysteresis for improved noise margin.
The FCT163827 has series current limiting resistors. This offers low
ground bounce, minimal undershoot, and controlled output fall times,
reducing the need for external series terminating resistors.
The inputs of the FCT163827 can be driven from either 3.3V or 5V
devices. This feature allows the use of these devices as translators in a
mixed 3.3V/5V supply system.
FUNCTIONAL BLOCK DIAGRAM
1OE1
1
28
2OE1
56
1OE2
29
2OE2
55
2
1A 1
1Y 1
2A 1
TO NINE OTHER CHANNELS
42
15
2Y 1
TO NINE OTHER CHANNELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
OCTOBER 2008
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© 2006 Integrated Device Technology, Inc.
DSC-3083/8
IDT74FCT163827A/C
3.3V CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 2.7V to 3.6V
Typ.(2)
Max.
Unit
2
—
5.5
V
2
—
VCC+0.5
–0.5
—
0.8
VI = 5.5V
—
—
±1
VI = VCC
—
—
±1
Input LOW Current (Input pins)
VI = GND
—
—
±1
Input LOW Current (I/O pins)
VIH
Min.
Input HIGH Current (I/O pins)
Symbol
Test Conditions(1)
VI = GND
—
—
±1
VO = VCC
—
—
±1
VO = GND
—
—
±1
—
–0.7
–1.2
V
–36
–60
–110
mA
mA
Parameter
Input HIGH Level (Input pins)
Guaranteed Logic HIGH Level
Input HIGH Level (I/O pins)
VIL
Input LOW Level (Input and I/O pins) Guaranteed Logic LOW Level
IIH
Input HIGH Current (Input pins)
IIL
IOZH
High Impedance Output Current
IOZL
(3-State Output pins)
VIK
Clamp Diode Voltage
VCC = Max.
IODH
Output HIGH Current
VCC = Max.
VCC = Min., IIN = –18mA
VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
(3)
(3)
IODL
Output LOW Current
VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
VOH
Output HIGH Voltage
VCC = Min.
IOH = –0.1mA
VIN = VIH or VIL
IOH = –3mA
VCC = 3V
IOH = –8mA
50
90
200
VCC-0.2
—
3
—
3
µA
µA
—
2.4
V
—
(5)
2.4
V
VIN = VIH or VIL
VOL
Output LOW Voltage
VCC = Min.
IOL = 0.1mA
—
—
0.2
VIN = VIH or VIL
IOL = 16mA
—
0.2
0.4
IOL = 24mA
—
0.3
0.55
VCC = 3V
IOL = 24mA
—
0.3
0.5
–60
–135
–240
mA
—
150
—
mV
—
0.1
10
µA
V
VIN = VIH or VIL
(4)
IOS
Short Circuit Current
VH
Input Hysteresis
ICCL
ICCH
ICCZ
Quiescent Power Supply Current
VCC = Max., VO = GND(3)
—
VCC = Max.
VIN = GND or VCC
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 3.3V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. VOH = VCC–0.6V at rated current.
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