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74FCT388915T-100PV

製品説明
仕様・特性

IDT74FCT388915T 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER (3-STATE) COMMERCIAL TEMPERATURE RANGE 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER (WITH 3-STATE) IDT74FCT388915T 70/100/133/150 FEATURES: DESCRIPTION: • 0.5 MICRON CMOS Technology • Input frequency range: 10MHz – f2Q Max. spec (FREQ_SEL = HIGH) • Max. output frequency: 150MHz • Pin and function compatible with FCT88915T, MC88915T • 5 non-inverting outputs, one inverting output, one 2x output, one ÷2 output; all outputs are TTL-compatible • 3-State outputs • Duty cycle distortion < 500ps (max.) • 32/–16mA drive at CMOS output voltage levels • VCC = 3.3V ± 0.3V • Inputs can be driven by 3.3V or 5V components • Available in 28 pin PLCC and SSOP packages The FCT388915T uses phase-lock loop technology to lock the frequency and phase of outputs to the input reference clock. It provides low skew clock distribution for high performance PCs and workstations. One of the outputs is fed back to the PLL at the FEEDBACK input resulting in essentially zero delay across the device. The PLL consists of the phase/ frequency detector, charge pump, loop filter and VCO. The VCO is designed for a 2Q operating frequency range of 40MHz to f2Q Max. The FCT388915T provides 8 outputs, the Q5 output is inverted from the Q outputs. The 2Q runs at twice the Q frequency and Q/2 runs at half the Q frequency. The FREQ_SEL control provides an additional ÷ 2 option in the output path. PLL _EN allows bypassing of the PLL, which is useful in static test modes. When PLL_EN is low, SYNC input may be used as a test clock. In this test mode, the input frequency is not limited to the specified range and the polarity of outputs is complementary to that in normal operation (PLL_EN = 1). The LOCK output attains logic HIGH when the PLL is in steady-state phase and frequency lock. When OE/RST is low, all the outputs are put in high impedance state and registers at Q, Q and Q/2 outputs are reset. The FCT388915T requires one external loop filter component as recommended in Figure 3. FUNCTIONAL BLOCK DIAGRAM FEED BAC K SYNC (0) SYNC (1) LOCK 0M u 1x Phase/Freq. Detector Voltage Controlled Oscilator Charge Pum p LF REF_SEL PLL_EN 0 1 M ux Divide -By-2 2Q ( ÷ 1) 1M ( ÷ 2) 0 u x D Q Q CP OE/RST Q2 Q Q3 Q Q4 Q Q5 Q Q/2 R D CP Q1 Q D FREQ_SEL Q0 CP R Q R D CP R D CP R D CP R D CP R The IDT logo is a registered trademark of Integrated Device Technology, Inc. COMMERCIAL TEMPERATURE RANGE OCTOBER 2008 1 © 2004 Integrated Device Technology, Inc. DSC-4243/7 IDT74FCT388915T 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER (3-STATE) COMMERCIAL TEMPERATURE RANGE CAPACITANCE (TA = +25°C, F = 1.0MHz) ABSOLUTE MAXIMUM RATINGS(1) Symbol Description Max Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +4.6 V CIN Input Capacitance VIN = 0V 4.5 6 pF VTERM(3) Terminal Voltage with Respect to GND –0.5 to +7 V COUT Output Capacitance VOUT = 0V 5.5 8 pF VTERM(4) Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +60 mA Symbol Parameter Conditions Typ. Max. Unit NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. Vcc terminals. 3. Input terminals. 4. Outputs and I/O terminals. DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Commercial: TA = 0°C to +70°C, VCC = 3.3V ± 0.3V Symbol Test Conditions(1) Parameter Min. Typ.(2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — 5.5 V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current(4) VCC = Max. VI = 5.5V — — ±1 µA IIL Input LOW Current(4) VCC = Max. VI = GND — — ±1 µA IOZH High Impedance Output Current(4) VCC = Max. VI = VCC — — ±1 µA IOZL (3-State Output Pins) VIK Clamp Diode Voltage IODH Output Drive Current VCC = Min., VIN = VIH or VIL, VO = 1.5V(3) 1.5V(3) IODL Output Drive Current VCC = Min., VIN = VIH or VIL, VO = VOH Output HIGH Voltage VCC = Min VOL VH Output LOW Voltage Input Hysteresis VCC = Min ICCL ICCH ICCZ Quiescent Power Supply Current VCC = Max.,VIN = GND or VCC (Test Mode) — — ±1 — VI = GND VCC = Min., IIN = –18mA –0.7 –1.2 V –36 — — mA — — mA 2.4(4) 3.3 — V IOL = 32mA — 50 IOH = –16mA — — 0.3 100 0.5 — V mV — 2 6 µA NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 3.3V, +25°C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. VOH = VCC - 0.6V at rated current. 3

ブランド

IDT

会社名

Integrated Device Technology, Inc.

本社国名

U.S.A

事業概要

通信・コンピュータ・一般向け機器などで使用する低消費電力で高性能なアナログ-デジタル混在半導体部品の設計と製造を行っている。主にOEM製品を扱っている。 RF(無線)、高性能タイミング、メモリーインタフェース、リアルタイムインターコネクト、オプティカルインターコネクト、ワイヤレス給電、スマートセンサーを製造するメーカー

供給状況

 
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