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部品型式

IDT74FCT162511ATPA

製品説明
仕様・特性

IDT54/74FCT162511AT/CT FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER MILITARY AND INDUSTRIAL TEMPERATURE RANGES FAST CMOS 16-BIT IDT54/74FCT162511AT/CT REGISTERED/LATCHED TRANSCEIVER WITH PARITY FEATURES: DESCRIPTION: • • • • The FCT162511T 16-bit registered/latched transceiver with parity is built using advanced dual metal CMOS technology. This high-speed, low-power transceiver combines D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The device has a parity generator/ checker in the A-to-B direction and a parity checker in the B-to-A direction. Error checking is done at the byte level with separate parity bits for each byte. Separate error flags exits for each direction with a single error flag indicating an error for either byte in the A-to-B direction and a second error flag indicating an error for either byte in the B-to-A direction. The parity error flags are open drain outputs which can be tied together and/or tied with flags from other devices to form a single error flag or interrupt. The parity error flags are enabled by the OExx control pins allowing the designer to disable the error flag during combinational transitions. The control pins LEAB, CLKAB, and OEAB control operation in the A-to-B direction while LEBA, CLKBA, and OEBA control the B-to-A direction. GEN/ CHK is only for the selection of A-to-B operation. The B-to-A direction is always in checking mode. The ODD/EVEN select is common between the two directions. Except for the ODD/EVEN control, independent operation can be achieved between the two directions by using the corresponding control lines. • • • • • • 0.5 MICRON CMOS Technology Typical tsk(o) (Output Skew) < 250ps, clocked mode Low input and output leakage ≤1µA (max) ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) VCC = 5V ±10% Balanced Output Drivers: – ±24mA (industrial) – ±16mA (military) Series current limiting resistors Generate/Check, Check/Check modes Open drain parity error allows wire-OR Available in the following packages: – Industrial: SSOP, TSSOP – Military: CERPACK FUNCTIONAL BLOCK DIAGRAM LEA B CLKAB OEAB Data Parity, data 16 Parity GEN/CHK A0-15 Byte Parity Generator/ Checker 2 18 B0-15 PB1,2 Latch/ Register PERB (Open Drain) PA1,2 ODD/EVEN LEB A CLKB A Parity, Data Parity, data 18 18 OEBA Latch/ Register Byte Parity Checking PERA (Open Drain) The IDT logo is a registered trademark of Integrated Device Technology, Inc. MILITARY AND INDUSTRIAL TEMPERATURE RANGES MAY 2001 1 © 2001 Integrated Device Technology, Inc. DSC-2916/2

ブランド

IDT

会社名

Integrated Device Technology, Inc.

本社国名

U.S.A

事業概要

通信・コンピュータ・一般向け機器などで使用する低消費電力で高性能なアナログ-デジタル混在半導体部品の設計と製造を行っている。主にOEM製品を扱っている。 RF(無線)、高性能タイミング、メモリーインタフェース、リアルタイムインターコネクト、オプティカルインターコネクト、ワイヤレス給電、スマートセンサーを製造するメーカー

供給状況

 
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