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OR3T80-5

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Preliminary Data Sheet, Rev. 1 September 1998 ORCA® Series 3 Field-Programmable Gate Arrays T Abundant hierarchical routing resources based on rout- Features T High-performance, cost-effective, 0.35 µm (OR3C) and T T T T T T T T T 0.3 µm (OR3T) 4-level metal technology, with a migration plan to 0.25 µm technology (4- or 5-input look-up table delay of 1.7 ns with -5 speed grade in 0.35 µm). Up to 186,000 usable gates in 0.3 µm, expanding to 320,000 usable gates in 0.25 µm. Up to 452 user I/Os. (OR3Txxx I/Os are 5 V tolerant to allow interconnection to both 3.3 V and 5 V devices, selectable on a per-pin basis.) Pin selectable I/O clamping diodes provide 5 V or 3.3 V PCI compliance and 5 V tolerance on OR3Txxx devices. New twin-quad programmable function unit (PFU) architecture with eight 16-bit look-up tables (LUTs) per PFU, organized in two nibbles for use in nibble- or byte-wide functions. Allows for mixed arithmetic and logic functions in a single PFU. Nine user registers per PFU, one following each LUT, plus one extra. All have programmable clock enable and local set/reset, plus a global set/reset that can be disabled per PFU. New flexible input structure (FINS) of the PFUs provides a routability enhancement for LUTs with shared inputs and the logic flexibility of LUTs with independent inputs. Fast-carry logic and routing to adjacent PFUs for nibble-, byte-wide, or longer arithmetic functions, with the new option to register the PFU carry-out. New softwired LUTs (SWL) allow fast cascading of up to three levels of LUT logic in a single PFU for up to 40% speed improvement. New supplemental logic and interconnect cell (SLIC) provides 3-statable buffers, up to 10-bit decoder, and PAL*-like AND-OR with optional INVERT in each programmable logic cell (PLC). T T T T T T T ing two data nibbles and two control lines per set provide for faster place and route implementations and less routing delay. TTL or CMOS input levels programmable per pin for the OR3Cxx (5.0 V) devices. Individually programmable drive capability: 12 mA sink/ 6 mA source or 6 mA sink/3 mA source. Built-in boundary scan (IEEE †1149.1 JTAG) and 3-state all I/O pins (TS_ALL) testability functions. Enhanced system clock routing for low skew, high-speed clocks originating on-chip or at any I/O. Up to four new ExpressCLK inputs allow extremely fast clocking of signals on- and off-chip plus access to internal general clock routing. New StopCLK feature to glitchlessly stop/start ExpressCLKs independently by user command. New programmable I/O (PIO) has: — Fast-capture input latch and input flip-flop (FF) latch for reduced input setup time and zero hold time. — Capability to (de)multiplex I/O signals. — Fast access to SLIC for decodes and PAL-like functions. — Output FF and two-signal function generator to reduce CLK to output propagation delay. — Fast open-drain drive capability. — Capability to register 3-state enable signal. * PAL is a trademark of Advanced Micro Devices, Inc. † IEEE is a registered trademark of The Institute of Electrical and Electronics Engineers, Inc. Table 1. ORCA Series 3 FPGAs Device Usable Gates‡ Max Registers Max User RAM Bits Max User I/Os Array Size OR3T20 OR3T30 OR3C/T55 OR3C/T80 OR3T125 OR3T165 18K—36K 24K—48K 40K—80K 58K—116K 92K—186K 120K—244K 1872 2436 3780 5412 8400 10752 18K 25K 41K 62K 100K 131K 192 224 288 352 448 512 12 x 12 14 x 14 18 x 18 22 x 22 28 x 28 32 x 32 ‡ The usable gate counts range from a logic-only gate count to a gate count assuming 30% of the PFUs/SLICs being used as RAMs. The logic-only gate count includes each PFU/SLIC (counted as 108 gates per PFU/SLIC), including 12 gates per LUT/FF pair (eight per PFU), and 12 gates per SLIC/FF pair (one per PFU). Each of the four PIOs per PIC is counted as 16 gates (two FFs, fast-capture latch, output logic, CLK drivers, and I/O buffers). PFUs used as RAM are counted at four gates per bit, with each PFU capable of implementing a 32 x 4 RAM (or 512 gates) per PFU.

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