BD645, BD647, BD649, BD651
NPN SILICON POWER DARLINGTONS
RoHS compliant*
Designed for Complementary Use with
BD646, BD648, BD650 and BD652
62.5 W at 25°C Case Temperature
TO-220 PACKAGE
(TOP VIEW)
8 A Continuous Collector Current
B
1
C
2
Minimum hFE of 750 at 3V, 3 A
E
3
This series is currently available, but
not recommended for new designs.
Pin 2 is in electrical contact with the mounting base.
MDTRACA
absolute maximum ratings at 25°C case temperature (unless otherwise noted)
RATING
BD645
BD647
Collector-base voltage (IE = 0)
BD649
SYMBOL
V CBO
BD651
Collector-emitter voltage (IB = 0)
BD649
BD651
Emitter-base voltage
Continuous collector current
80
UNIT
100
120
V
140
BD645
BD647
VALUE
60
V CEO
VEBO
IC
80
100
120
V
5
V
12
A
8
A
Peak collector current (see Note 1)
ICM
Continuous device dissipation at (or below) 25°C case temperature (see Note 2)
Ptot
62.5
W
½LIC2
50
mJ
Continuous base current
Continuous device dissipation at (or below) 25°C free air temperature (see Note 3)
Unclamped inductive load energy (see Note 4)
Operating junction temperature range
Storage temperature range
Lead temperature 3.2 mm from case for 10 seconds
NOTES: 1.
2.
3.
4.
IB
Ptot
0.3
2
Tj
-65 to +150
TL
260
Tstg
-65 to +150
A
W
°C
°C
°C
This value applies for tp ≤ 0.3 ms, duty cycle ≤ 10%.
Derate linearly to 150°C case temperature at the rate of 0.4 W/°C.
Derate linearly to 150°C free air temperature at the rate of 16 mW/°C.
This rating is based on the capability of the transistor to operate safely in a circuit of: L = 20 mH, IB(on) = 5 mA, RBE = 100 Ω,
V BE(off) = 0, RS = 0.1 Ω, VCC = 20 V.
How to Order
Device
Package
BDxxx
TO-220
Carrier
Order As
Tube
.BDxxx-S
Insert xxx transistor type number 645, 647, 649, etc.
MAY 1993 - REVISED JUNE 2013
*RoHS Directive 2002/95/EC Jan. 27, 2003 including annex and RoHS Recast 2011/65/EU June 8, 2011.
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.
1