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74AC00
54AC 74AC00 54ACT 74ACT00 Quad 2-Input NAND Gate General Description Features The ’AC ’ACT00 contains four 2-input NAND gates Y Y Y Y Commercial ICC reduced by 50% Outputs source sink 24 mA ’ACT00 has TTL-compatible inputs Standard Military Drawing (SMD) ’AC00 5962-87549 ’ACT00 5962-87699 Package Number Military 74AC00PC Package Description N14A 54AC00DM (Note 2) 14-Lead (0 300 Wide) Molded Dual-In-Line J14A 14-Lead Ceramic Dual-In-Line 74AC00SC (Note 1) M14A 14-Lead (0 150 Wide) Molded Small Outline JEDEC 74AC00SJ (Note 1) M14D 14-Lead (0 300 Wide) Molded Small Outline EIAJ 74AC00MTC (Note 1) MTC14 14-Lead Molded Thin Shrink Small Outline JEDEC 74AC00FM (Note 2) W14B 14-Lead Cerpak 74AC00LM (Note 2) E20A 20-Lead Ceramic Leadless Chip Carrier Type C N14A 14-Lead (0 300 Wide) Molded Dual-In-Line 74ACT00PC J14A 14-Lead Ceramic Dual-In-Line 74ACT00SC (Note 1) 54ACT00DM (Note 2) M14A 14-Lead (0 150 Wide) Molded Small Outline JEDEC 74ACT00SJ (Note 1) M14D 14-Lead (0 300 Wide) Molded Small Outline EIAJ 74ACT00MTC (Note 1) MTC14 14-Lead Molded Thin Shrink Small Outline JEDEC 74ACT00FM (Note 2) W14B 14-Lead Cerpak 74ACT00LM (Note 2) E20A 20-Lead Ceramic Leadless Chip Carrier Type C Note 1 Devices also available in 13 reel Use suffix e SCX SJX and MTCX Note 2 Military grade device with environmental and burn-in processing Use suffix e DMQB FMQB and LMQB Logic Symbol Connection Diagrams Pin Assignment for DIP Flatpak SOIC and TSSOP IEEE IEC TL F 9911–1 Pin Names TL F 9911 – 2 TL F 9911 – 3 Description An Bn On Pin Assignment for LCC Inputs Outputs FACTTM is a trademark of National Semiconductor Corporation C1996 National Semiconductor Corporation TL F 9911 RRD-B30M96 Printed in U S A http www national com 54AC 74AC00 54ACT 74ACT00 Quad 2-Input NAND Gate September 1996 DC Characteristics for ’AC Family Devices (Continued) 74AC Symbol Parameter 54AC 74AC TA e a 25 C VCC (V) TA e b 55 C to a 125 C TA e b 40 C to a 85 C Typ IOLD Minimum Dynamic Output Current IOHD ICC Maximum Quiescent Supply Current Units Conditions VOLD e 1 65V Max Guaranteed Limits 55 50 75 mA 55 b 50 b 75 mA VOHD e 3 85V Min mA VIN e VCC or GND 55 20 40 0 20 0 Maximum test duration 2 0 ms one output loaded at a time Note IIN and ICC 3 0V are guaranteed to be less than or equal to the respective limit ICC for 54AC 25 C is identical to 74AC 5 5V VCC 25 C DC Characteristics for ’ACT Family Devices 74ACT 54ACT 74ACT TA e a 25 C TA e b 55 C to a 125 C TA e b 40 C to a 85 C Parameter VCC (V) VIH Minimum High Level Input Voltage 45 55 15 15 20 20 20 20 20 20 V VOUT e 0 1V or VCC b 0 1V VIL Maximum Low Level Input Voltage 45 55 15 15 08 08 08 08 08 08 V VOUT e 0 1V or VCC b 0 1V VOH Minimum High Level Output Voltage 45 55 4 49 5 49 44 54 44 54 44 54 V 3 86 4 86 3 70 4 70 3 76 4 76 V 01 01 01 01 01 01 V IOUT e 50 mA 45 55 0 36 0 36 0 50 0 50 0 44 0 44 V IOL g0 1 g1 0 g1 0 mA VI e VCC GND 16 15 mA VI e VCC b 2 1V Symbol Typ 45 55 VOL Maximum Low Level Output Voltage 45 55 IIN Maximum Input Leakage Current 55 ICCT Maximum ICC Input 55 IOLD Minimum Dynamic Output Current 0 001 0 001 IOHD ICC Maximum Quiescent Supply Current Units Conditions Guaranteed Limits 06 IOUT e b50 mA VIN e VIL or VIH b 24 mA IOH b 24 mA VIN e VIL or VIH 24 mA 24 mA 55 50 75 mA VOLD e 1 65V Max 55 b 50 b 75 mA VOHD e 3 85V Min 40 0 20 0 mA VIN e VCC or GND 55 20 All outputs loaded thresholds on input associated with output under test Maximum test duration 2 0 ms one output loaded at a time Note ICC for 54ACT 25 C is identical to 74ACT 25 C 3 http www national com
NS
National Semiconductor Corporation 日本ではナショセミと略称されていたが2011年9月23日、米TI社に買収され、同社のシリコンバレー部門となった。
TI
Texas Instruments Incorporated
U.S.A
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